MF Workshop 2008

Workshop

Quantitative Ultra-high Resolution Electron Microscopy

Dirk Van Dyck
University of Antwerp, Belgium

Disclosing the secrets of the exit wave

Fu-Rong Chen
National Tsing-Hua University, Taiwan

The Development of a Focus Plate for Structural Reversion

Robert Klie
University of Illinois

High resolution Z contrast and EELS of complex oxides (working title)

M. Moewe
LBNL

Atomically Sharp Catalyst-Free Self-Assembled Wurtzite GaAs/AlGaAs Nanoneedles Grown on Si Substrates

Aaron Kueck
LBNL

Understanding the Origin of Toughness in Brittle Materials: Atomic Resolution Imaging of Rare Earth Doped SiC

Joachim Mayer
Ernst Ruska Centre

The Advancement of Electrons Microscopy - A global Challenge