Date: Tuesday, March 11, 2014
Time: 11:00 am
Speaker: Dr. Peter Fischer, Center for X-ray Optics, LBNL
Title: Full-field soft x-ray microscopy: a unique tool for nano- and mesoscience
Location: 67-3111 Chemla Room
For more than a decade research has focused on a fundamental understanding and control of nanoscale behavior. Recently, it has been recognized, that the next step beyond the nanoscale will be governed by mesoscale phenomena , since those are supposed to add complexity and functionality, which are essential parameters to enhance the performance of novel technologies in terms of speed, size, and energy efficiency. A coherent effort of synthesis, characterization and theoretical description is needed to achieve those nano- and mesoscience goals and advanced characterization tools will be essential key elements. The development and application of multidimensional and multiparameter visualization techniques, spanning multiple length and time scales with elemental specificity will provide valuable insight into the properties and behavior of advanced materials.
Full-field soft x-ray spectromicroscopy  is a unique analytical technique combining high spatial (2D and 3D) resolution down to almost 10nm due to state-of-the-art x-ray optics  with the spectroscopic power of soft x-rays, i.e. fingerprinting the electronic structure with X-ray absorption. Utilizing the inherent time structure of current and future x-ray sources allows further to study dynamical phenomena of e.g. electronic and magnetic structures spanning multiple time scales from nsec to ultimately the fsec regime.
XM-1 is a full-field soft x-ray microscope at the Advanced Light Source, which is operational since 1994 and is currently used by a large variety of users covering research areas from materials sciences, environmental sciences, energy sciences and magnetism. I will describe its current capabilities and future potential by selected examples from recent research [3,4] .
 BESAC report: From Quanta to the Continuum: Opportunities for Mesoscale Science (2012), http://science.energy.gov/~/media/bes/pdf/reports/files/OFMS_rpt.pdf
 D.T. Attwood, D.T. Attwood, Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications, Cambridge University Press, Cambridge (1999)
 W. Chao, P. Fischer, T. Tyliszczak, S. Rekawa, E. Anderson, P. Naulleau, Optics Express 20(9) 9777 (2012)
 M.-Y. Im, P. Fischer, Y. Keisuke, T. Sato, S. Kasai, Y. Nakatani, T. Ono, Nature Communications 3 983 (2012)
 R. Streubel. D. Makarov, D. Karnaushenko, L. Han, O. G. Schmidt, J. Lee, S.-K. Kim, R. Schäfer, M.-Y. Im, P. Fischer Adv. Mater (2013) http://dx.doi.org/10.1002/adma.201303003