See the Foundry's full equipment list

Imaging Capabilities & Tools

Instrument Scheduler

Major Capabilities: Instruments and Labs

JEOL 2100-F 200 kV Field-Emission Analytical Transmission Electron Microscope

This instrument is equipped with an analytical pole piece, a high solid-angle EDS (energy dispersive spectroscopy) system for elemental x-ray analysis, a Gatan Tridiem spectrometer for energy-filtered imaging and spatially-resolved EELS (electron energy loss spectroscopy), a HAADF (high-angle annular dark field) STEM detector, and several digital cameras. Single and double tilt sample holders and software for TEM tomography (3D image reconstruction).

Zeiss Libra 120 Cryo-TEM

Zeiss Gemini Ultra-55 Analytical Field Emission Scanning Electron Microscope

This microscope is used for imaging and analysis of conducting and insulating samples. The SEM has multiple detectors including in-lens and conventional secondary electron detectors, in-lens and quadrant backscatter detectors, an EDS system for elemental x-ray analysis, and a transmission (STEM) bright/dark field detector compatible with standard TEM grids. Beam energy is variable between 100 eV and 30 kV, with 1 nm resolution above 2 kV and several nm resolution at 100 eV. A range of sample holders are available including standard SEM stubs, wafers to 4", flat, tilted and cross section holders for wafer pieces, and for TEM grids.

PHI 5400 X-ray Photoelectron Spectroscopy (XPS) System 

This system allows:

  • conventional (non-monochromatic) Al/Mg Dual-Anode X-ray source
  • spatial resolution 0.5 mm, energy resolution 0.7 eV
  • conducting or insulating samples (ultra-high vacuum compatible) up to 20 mm square, 4 mm thick
  • 4 kV Argon ion sputtering for sample cleaning and shallow (100 nm) depth profiles
  • elemental and chemical state analysis of the first few nm of the surface with ~ 1 atomic percent sensitivity

Zeiss Gemini Supra 55 VP-SEM

This instrument, used for in situ microscopy, has SEM in-lens and conventional secondary detectors, quadrant backscatter detector and a variable pressure (10-100 Pa) secondary detector. It can be configured for various types of in situ experiments including nano-manipulation, scanning probe microscope imaging, mechanical and electrical characterization, cathodoluminescence, and in situ chemical and thermal reactions.

Asylum MFP-3D Atomic Force Microscope 

This microscope has a 90 micron closed-loop XY scanner, Z displacement and integrated optical imaging. A range of AFM contrast methods are available including contact imaging, non-contact ("tapping") phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, AMFM, nanoindentation, and magnetic imaging with variable field unit. The system has numerous small-volume closed fluid cell that can be used for rapid, controlled humidity experiments or liquid experiments with fluid exchange. Sample heating is available for work in liquids. The control software is easily customized for specialized force or lithography experiments.

Bruker Multimode 8

This microscope has a 90 micron JV scanner for large scans, 10 micron EV scanner, and 1 micron A scanner for very high resolution work. An integrated optical microscope provides easy sample location with 5 micron resolution. A range of AFM contrast methods are available including contact imaging, non-contact ("tapping") phase and amplitude imaging, Quantitative Nanomechanical Mapping (Peak Force Tapping). Sample temperature control is available. The closed fluid cell has 100 microliter volume for precious analytes. The control software is highly automated and easy to use.

Agilent (Molecular Imaging) PicoPlus Scanning Probe Microscope

This microscope is used for in situ imaging in air, controlled gas/humidity or in liquids, including under electrochemical control. This system includes 90 micron and 5 micron AFM scanners and a 1 micron STM scanner. A range of AFM contrast methods are available including contact/friction imaging, non-contact ("tapping") phase and amplitude imaging, and electrical methods including conductivity, tunneling, electrostatic and Kelvin probe surface potential imaging. Atomic lattice resolution on gold or mica can be routinely achieved with suitable tips.

Foundry-built ultra-fast, low noise AFM

During 2010 and 2011 this microscope had an ultra-low noise head built around a 5 micron closed-loop XYZ scanner for high resolution work using an Asylum Research controller. In 2012 a new head was built for high speed scanning with beam reflection or interferometric deflection detection with 2 MHz bandwidth. The microscope now has a 10 micron scanner achieving 10 frames per second with 50 kHz Z piezo bandwidth. 

Oxford/Omicron Nano-Auger

Broadly tunable ultra-fast laser system (Coherent MiraTi:SAF + OPG) operating in picosecond and femtosecond modes. Supported capabilities include:

  • TDTR
  • TPPL
  • 1P and 2P TRPL
  • Photon correlation spectroscopies; Antibunching
  • SHG

NT-MDT near-field imaging and optical AFM (Coming soon)

Support Capabilities/Equipment:

Standard Optical Microscopy Station that includes:

  • Visible and infrared CW laser sources
  • Optical grating spectrometers with CCD cameras/detectors (nitrogen cooled and electron-multiplied), single photon counting modules
  • Diffraction-limited confocal optical spectroscopy station (#1) for scattering, Raman, and fluorescence (both linear and nonlinear), including measurements on single molecules and nanostructures; dark field scattering, etc.

Leica DM4000 Optical Microscope

This microscope is appropriate for materials science (non-inverted, dry samples). 5x to 100x objectives; bright field/dark field/DIC/Polarization in transmitted or reflected light; color camera and software.

Leica MZ16 Stereo microscope

Appropriate for sample inspection, probing and manipulation, 19 mm working distance, magnification 11 to 180x, color camera and software.

Wire Bonder

Tunable near-infrared laser (745nm-795nm)

Sample preparation tools

Various sample preparation tools including Langmuir Blodgett trough, UV ozone cleaner, oxygen plasma cleaner, mg balance, ultrasonic bath, 200 C oven and thermal evaporator. Ultra-microtome, plunge freezer, fiber probe assembly station, TEM liquid cell assembly.

Support Facilities

Standard Optical Microscopy Station that includes:

  • Visible and infrared CW laser sources
  • Optical grating spectrometers with CCD cameras/detectors (nitrogen cooled and electron-multiplied), single photon counting modules
  • Diffraction-limited confocal optical spectroscopy station (#1) for scattering, Raman, and fluorescence (both linear and nonlinear), including measurements on single molecules and nanostructures; dark field scattering, etc.

Leica DM4000 Optical Microscope

This microscope is appropriate for materials science (non-inverted, dry samples). 5x to 100x objectives; bright field/dark field/DIC/Polarization in transmitted or reflected light; color camera and software.

Leica MZ16 Stereo microscope

Appropriate for sample inspection, probing and manipulation, 19 mm working distance, magnification 11 to 180x, color camera and software.

Wire Bonder

Tunable near-infrared laser (745nm-795nm)

Sample preparation tools

Various sample preparation tools including Langmuir Blodgett trough, UV ozone cleaner, oxygen plasma cleaner, mg balance, ultrasonic bath, 200 C oven and thermal evaporator. Ultra-microtome, plunge freezer, fiber probe assembly station, TEM liquid cell assembly

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