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D. Frank Ogletree
Staff Engineer, Imaging and Manipulation of Nanostructures
Postdoctoral Research Fellow with Miquel Salmeron developing ultra-high vacuum scanning tunneling microscopy in the Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, 1987 – 1988.
Ph.D. in Experimental Solid State Physics, 1986, University of California, Berkeley, California. Thesis title: "Extending the Range of Low Energy Electron Diffraction (LEED) Surface Structure Determination", advisor Prof. G. A. Somorjai, Department of Chemistry.
A.B. with honors in Physics, 1977, College of the University of Chicago, Chicago, Illinois.
Previous Professional Positions
Staff Engineer/Physicist and acting Lead Scientist, Molecular Foundry Imaging and Manipulation Facility, Materials Sciences Division, Lawrence Berkeley National Laboratory, 2005 - present.
Technical Equipment Manager, Imaging and Manipulation Facility, Molecular Foundry, Lawrence Berkeley National Laboratory, 2004 - 2005.
Staff Scientist/Physicist, Materials Sciences Division, Lawrence Berkeley National Laboratory, 1992 - 2005.
Adjunct Professor, Faculty of Applied Sciences, Free University of Brussels, Belgium (Maître du Conference, Faculté des Sciences Appliquées, Université Libre de Bruxelles), 1996 - present.
Manager, Surface Analysis Facility, Materials Sciences Division, Lawrence Berkeley National Laboratory, 1989 – 2005.
Senior Research Associate, Materials Sciences Division, Lawrence Berkeley National Laboratory, 1989 - 1991.
Postdoctoral Research Fellow, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, 1987 - 1988.
My research is centered on developing in-situ imaging and characterization tools to understand interfacial properties of nanoscale systems. These include electron diffraction and scanning probe microscope (STM and AFM) instruments and methods to study structure and interactions of small molecules on metal surfaces; AFM methods to study friction and liquid-solid interactions; ambient pressure photoemission instruments for in-situ studies of catalytic processes and liquid-solid interactions; and near-field optical microscopy (scanning probe and cathodoluminesence) for investigating electro-optical properties of nanostructures. I am now developing combined electron beam and optical near-field probes to study energy transport at the nanoscale.
Fundamental surface chemistry of metals by STM
Electronic contribution to friction on GaAs: An atomic force microscope study
The electronic contribution to friction at semiconductor surfaces was investigated by using a Pt-coated tip with 50 nm radius in an atomic force microscope sliding against an n-type GaAs(100) substrate. Read full research paper
Development of a combined scanning probe/electron microscope system for nanostructure characterization and manipulation.
Development of novel and self-sensing probes for scanning probe microscopy
(with Ivo Rangelow, T.U. Illmanau, and Stefano Cabrini, Molecular Foundry).
Integration of scanning probe microscopy with optical spectro-microscopy
(with Jim Schuck, Molecular Foundry).
- Mapping Local Charge Recombination Heterogeneity by Multidimensional Nanospectroscopic Imaging, (1 citation), Wei Bao, M. Melli, N. Caselli, F. Riboli, D. S. Wiersma, M. Staffaroni, H. Choo, D. F. Ogletree, S. Aloni, J. Bokor, S. Cabrini, F. Intonti, M. B. Salmeron, E. Yablonovitch, P. J. Schuck, A. Weber-Bargioni, Science 338, 1317 (2012).
- Strain engineering and one-dimensional organization of metal-insulator domains in singlecrystal VO2 beams. (89 Citations) J. Cao, E. Ertekin, V. Srinivasan, S. Huang, W. Fan, H. Zheng, J. W. L. Yim, D. R. Khanal, D. F. Ogletree, J. C. Grossman and J. Wu, Nature Nanotechnology 4 732 (2009).
- In situ Spectroscopic Study of the Oxidation and Reduction of Pd(111). (88 citations) Guido Ketteler, D. Frank Ogletree, Hendrik Bluhm, Hongjian Liu, Eleonore L.D. Hebenstreit, and Miquel Salmeron, Journal of the American Chemical Society 127, 18269-18273 (2005).
- Water diffusion and clustering on Pd(111). (160 citations), T. Mitsui, M. K. Rose, E. Fomin, D. Frank Ogletree and M. Salmeron, Science 297, 1850-1852 (2002).
- A differentially pumped electrostatic lens system for photoemission studies in the millibar range. (162 citations), D. Frank Ogletree, Hendrick Bluhm, Gennadi Lebedev, Charles S. Fadley, Z. Hussain and Miquel Salmeron. Review of Scientific Instruments 73, 3872 (2002).
- Calibration of frictional forces in atomic force microscopy (287 citations), D. F. Ogletree, R. W. Carpick and M. Salmeron, Review of Scientific Instruments 67 3298 (1996).
- Probing the interaction between two single molecules: Fluorescence resonance energy transfer between a single donor and a single acceptor. (520 citations), T. Ha, Th. Enderle, D. F. Ogletree, D. S. Chemla, P. Selvin and S. Weiss, Proceedings of the National Academy of Sciences 93 624 (1996).
- Imaging the Condensation and Evaporation of Molecularly Thin Films of Water with Nanometer Resolution (278 citations), J. Hu, X.-D. Xiao, D. F. Ogletree and M. Salmeron, Science 268 267 (1995).
- Si donors (SiGa) in GaAs observed by scanning tunneling microscopy.(168 citations), J. F. Zheng, X. Liu, E. R. Weber, D. F. Ogletree and M. B. Salmeron, Journal of Vacuum Science and Technology B 12 2104(1994).
- Benzene and carbon monoxide adsorbed on Pt(111): A LEED intensity analysis (105 citations), D. F. Ogletree, M. A. Van Hove and G. A. Somorjai, Surface Science 183 1 (1987).
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