Staff Scientist, NCEM
Peter Ercius graduated from Cornell University with a B.S. in applied and engineering physics in 2003. He remained at Cornell and completed a Ph.D. in applied and engineering physics with Professor David Muller in 2009. His dissertation project involved three-dimensional imaging of semiconductor devices using STEM. He then joined NCEM as a collaborative postdoctoral researcher for 2 years to implement electron tomography at the center while pushing the limits of three-dimensional analysis to atomic resolution. Peter is currently the staff scientist in charge of the dual aberration corrected TEAM I at NCEM, which has a DCOR probe corrector and CCOR chromatic-aberration image corrector. He collaborates with users of the center on a wide range of projects including S/TEM atomic resolution imaging, electron tomography and electron energy loss spectroscopy (EELS).
Dr. Ercius is an expert in three-dimensional imaging and analysis of nano-structures in the electron microscope with a focus on the application of advanced aberration corrected scanning transmission electron microscopy (STEM). He is exploring the capabilities of the transmission electron aberration-corrected microscopes (TEAM) microscopes at NCEM to advance the resolution of electron tomography to the atomic level with the possibility of element specificity. He also works on aberration correction in conventional TEM mode with a chromatic aberration corrector to investigate materials with atomic resolution. Research interests include: