Staff Scientist, NCEM
Christian Kisielowski was awarded his PhD in natural sciences and his habilitation in physics performing spectroscopic studies on defects in semiconductors at the University of Cologne, Germany in 1985 and 1990, respectively. Thereafter, he joined AT&T Bell Laboratories (1991 – 1994) where he established a new quantitative method for image analyses in high resolution electron microscopy (QUANTITEM). From 1994 through 1997, he lead research efforts to develop GaN thin film growth by molecular beam epitaxy at the University of California, Berkeley. He joined NCEM in 1997.
Dr. Kisielowski focuses on time and spatially-resolved structural and spectroscopic investigations of functionality on the single atom level in environmentally-meaningful conditions. This is achieved by developing transmission electron microscopy with variable dose rates and voltages (20kV -300 kV). Such capabilities are of significant interest to biological, chemical, and materials sciences in the emerging field of electron microscopy for sustainable energy research.