
Staff Scientist, Imaging and Manipulation of Nanostructures
510.486.4862
Biography
Education
- 1986 University of California, Berkeley Ph.D., Experimental Solid State Physics
- 1977 College of the University of Chicago, Illinois. A.B. (artium baccalaureus), Physics
Research Interests
My research is centered on developing in-situ imaging and characterization tools to understand interfacial properties of nanoscale systems. These include electron diffraction and scanning probe microscope (STM and AFM) instruments and methods to study structure and interactions of small molecules on metal surfaces; AFM methods to study friction and liquid- solid interactions; ambient pressure photoemission instruments for in-situ studies of catalytic processes and liquid-solid interactions; and near-field optical microscopy (scanning probe and cathodoluminesence) for investigating electro-optical properties of nanostructures. I am now developing combined electron beam and optical near-field probes to study energy transport at the nanoscale
Invited Lectures
- “In Operando Imaging and Spectroscopy with Electrons.” TAILOR-2014 (TAILored surfaces in Operando conditions: structure and Reactivity), St.-Paule-de-Vence, France, April 2014
- “Electrons and Photons: Nanoscale Optical Properties and Cathodoluminesence.” KRICT, Korea Research Institute of Chemical Technology, Daejon, South Korea, December 2014
- “Electrons and Photons: Nanoscale Optical Properties and Cathodoluminesence.” KAIST, Korean Advanced Institute for Science and Technology, Daejon, South Korea, December 2014
- “In Operando Imaging and Spectroscopy with Electrons.” VUB Workshop on Near-Ambient Pressure Photoemission, Vrije Universiteit Brussel, Brussels, Belgium, March 2015
- “Fundamentals of X-Ray Excitation and Relaxation in EUV Resists.” EUVL-2016 International Workshop on EUV Lithography, Berkeley, California, June 2016
Awards
- R&D 100 Award, 2013, Lawrence Berkeley Lab (Molecular Foundry and MSD), for Campanile Probe: Nano-Optical Imaging (with Alex Weber-Bargioni, P. James Schuck, Stefano Cabrini et al.)