The following instruments are available to Molecular Foundry staff and users through an MOU between the Chemical Sciences Division and the Molecular Foundry Division. Contact Finn Babbe for more information. To request instrument access, please use this form.
Atomic Layer Deposition (Room 106)
Thermal (H2O and O3). Chemical vapor deposition of extremely thin (1 monolayer or greater) conformal layers of metal oxide insulators onto substrates for passivation of surface defects, carrier selective contacts, and corrosion protection layers.
Gemstar-6
- TiO2: TTIP, TdMaTi
- Al2O3: TMA
- ITO: TdMaS
NMR (Room 105)
Bruker Advance III 500 High Performance Ascend NMR (500 MHz / 54 mm Ascend)
Topshim 3.6.2
Probe: PA BBO 500S1 BBF-H-D-05 ZSP
Autosampler
Ellipsometer (Room 106)
Used for determining the complex dielectric properties of thin films materials from 180 – 1600 nm including reflection and transmission intensities
Real-Time Gas Analyzer (Room 107)
Atmospheric mass spectrometer system for identifying CO2 reduction products and other chemical reactions in aqueous of gas environments in real-time
Hall Effect (Room 105)
Determination of carrier concentration and type (p- or n-type) for semiconducting materials
Mapping Ellipsometer (Room 120)
Used for determination of complex dielectric properties of thin films materials from 180 – 1600 nm including reflection and transmission intensities, with in-situ temperature control (100 – 1200 K), in-situ electrochemical cell
JA Woollam M-2000DI
SEM (Room 122)
~50 nm resolution imaging microscope , and elemental mapping by energy dispersive x-ray (EDX) with environmental mode.
FEI Quanta FEG-250
Raman Confocal Microscope (Room 123)
Measurement of Raman spectra of materials to determine crystallographic phase identification, quality, and transformations including under in-operando electrochemical conditions
-Horiba Jobin Yvon LabRam HR 800, high resolution Raman microscopy with 633 / 532 nm excitation and XY mapping stage, 1800 and 600 lines gratings.
EPR – Electron Paramagnetic Resonance (Bldg. 70A)
The pulsed EPR in Bldg 70A is equipped with X- and Q-band EPR capability (Bruker Instruments (Billerica, MA) Elexsys 580 pulsed EPR spectrometer: dual-mode ER4116DM cavity, high sensitivity cavity ER4119HS, standar cavity ER 4102ST, X band ENDOR resonator E560D-P DICE and Q band ENDOR resonator EN5107D2).
It has an Oxford Instruments E900 helium flow cryostat that enables variable temperature measurements from 5K and above with a temperature controller, Oxford ITC 5035. For pulsed EPR measurements, there is a traveling wave tube amplifier (microwave frequency) from Applied System Engineering, INC and a radio wave frequency amplifier from Amplifier Research.
