The following instruments are available to Molecular Foundry staff and users through an MOU between the Chemical Sciences Division and the Molecular Foundry Division. Contact Finn Babbe for more information. To request instrument access, please use this form.
XRD (Room 113)
This Rigaku X-ray Diffraction (XRD) instrument is used for determining crystal structure and film thickness. It features a 2D HyPix detector, an in-plane mode optimized for ultra-thin film characterization, and an Eulerian cradle for pole figure analysis. Additionally, the system allows for in-situ characterization of materials during thermal processing in various atmospheres (air, Ar, N, NH3, O2) up to 800°C.
This system should be requested for advanced measurements, such as grazing incidence, in-plane, X-ray reflection, pole figures, and temperature-dependent studies. For standard XRD measurements, please utilize either the XRD instrument in the inorganic nanostructures facility or the powder XRD in the organic and macromolecular synthesis facility.
XPS (Room 119)
The Kratos Axis Ultra DLD system offers monochromatized Al K-alpha, non-monochromatic Al and Mg emission, and Ultraviolet Photoelectron Spectroscopy (UPS) with a He source. It also provides capabilities for depth profiling using Ar-ion sputtering, sample heating and cooling, and angle-dependent measurements.
Request this instrument for measurement campaigns involving larger number of samples or requiring a high number of scans per element. For standard XPS measurements, please utilize the XPS hosted by the Imaging and Manipulation of Nanostructures facility. (Limited capacity for Foundry users).
Mapping Ellipsometer (Room 120)
The JA Woollam M-2000DI Mapping Ellipsometer determines the complex dielectric properties of thin film materials across a spectral range of 180 to 1600 nm, including reflection and transmission intensities. This system is equipped with in-situ temperature control, allowing measurements from 100 to 1200 K, and an integrated in-situ electrochemical cell.
NMR (Room 120)
This is a Bruker Advance III 500 High Performance Ascend Nuclear Magnetic Resonance (NMR) spectrometer, operating at 500 MHz with a 54 mm Ascend magnet. It utilizes Topshim 3.6.2 software and is equipped with a PA BBO 500S1 BBF-H-D-05 ZSP probe, along with an autosampler for efficient sample processing.
SEM (Room 122)
The FEI Quanta FEG-250 Scanning Electron Microscope (SEM) provides imaging with approximately 50 nm resolution. It also offers elemental mapping capabilities via energy dispersive X-ray (EDX) spectroscopy, including an environmental mode for various sample types.
Raman Confocal Microscope (Room 123)
The Horiba Jobin Yvon LabRam HR 800 Raman Confocal Microscope is used for measuring Raman spectra of materials. This high-resolution system enables the determination of crystallographic phase identification, material quality, and transformations, even under in-operando electrochemical conditions. It features 633 nm and 532 nm excitation lasers, an XY mapping stage, and both 1800 and 600 lines gratings.
ICP-MS (Room 305)
Analytical technique for measuring elements at trace levels in liquids and dissolved samples. Instrument: Agilent ICP-MS 7900
