JEOL 2100-F 200 kV Field-Emission Analytical Transmission Electron Microscope
The JEOL 2100-F is a Field Emission Transmission Electron Microscope (FETEM) equipped with an analytical pole piece, an Oxford high solid-angle Silicon Drift Detector (SDD) X-Ray Energy Dispersive Spectrometer (EDS) system for chemical elemental analysis, a Gatan Tridiem Electron Energy Loss Spectrometer (EELS) for energy-filtered imaging and spatially resolved EELS, a High-Angle Annular Dark Field (HAADF) detector, and several digital cameras. In addition to the single-tilt, double-tilt and analytical sample holders a variety of in situ holders including cryo-transfer, cooling, biasing and liquid flow are available. The microscope is aligned for 3 electron beam energies: 80 keV, 120 KeV and 200 keV. It can either be used with a wide beam or a very fine focused beam, down to few angstroms in diameter, in a scanning/transmission mode (STEM).
The instrument is capable to deliver atomic resolution images, structural and chemical information of ultra-thin specimens (thickness less than 200 nm).
