The JEOL F200 (S)TEM is a 200kV microscope with a high brightness cold field emitting gun. The scope is equipped with a Gatan Clearview Camera which enables high resolution TEM at high frame rates (1600fps), and a Dectris ARINA hybrid pixel detector, which enables scanning nanobeam diffraction (4DSTEM) experiments. The high solid angle (1.4sr) EDS detector enable high speed chemical composition mapping. Additionally, nanosecond beam blanking enables novel scanning modalities which minimize beam induced damage on sensitive specimens.
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