The FEI/ThermoFisher Helios 5 UX dual beam Focused Ion Beam (FIB) is used for TEM sample preparation, taking advantage of the focused Ga+ ion beam for site-selective material removal and the monochromated field emission scanning electron microscope (SEM) column for imaging. Platinum or tungsten can be deposited for sample protection before thinning or for lift-out procedures with an EasyLift rotatable needle.
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