Zeiss Ultra 60-SEM
The Zeiss Ultra 60 is a Scanning Electron Microscope using the good imaging capabilities of the GEMINI® field emission column (FESEM). It comprises dual In-column detectors for ultra high resolution topographical and compositional imaging. The new In-column EsB (Energy selective Backscatter) detector is less sensitive for edge contrast and charging effects which enables precise feature imaging and reliable metrology. It delivers superb materials contrast and crystallographic imaging.
