UV-Vis-NIR Spectrophotometer
Instrument Manager: Steve Shelton
The Agilent Cary 5000 UV-Vis-NIR spectrometer measures absorbance from 175–3300 nm for solid, liquid, and thin film samples in transmission mode. An Internal Diffuse Reflectance Accessory (DRA-2500) allows for specular and diffuse reflectance measurements from 200–2500 nm for solid samples.
Quantaurus-QY Spectrometer
Instrument Manager: Steve Shelton
The Hamamatsu Quantaurus-QY Plus spectrometer allows for measurement of absolute photoluminescence quantum yield in the wavelength range of 400-1650nm (UV-NIR). It is equipped with a xenon lamp for monochromatic excitation of luminescent materials, a photonic multichannel analyzer, an integrating sphere, and analysis software. A low-temperature accessory is available for cooling solutions in liquid nitrogen.
Horiba Nanolog Spectrofluorometer
Instrument Manager: Steve Shelton
The Nanolog spectrofluorometer measures the photophysical properties of materials such as organic molecules, quantum dots, and carbon nanotubes. It detects steady-state and time-resolved photoluminescence (fluorescence and phosphorescence) throughout the UV/Vis/NIR spectrum (250 – 1700nm). Samples are excited with either a xenon lamp or pulsed LED light source. Emission is detected with a combination of two single channel (UV-Vis and NIR) and one multi-channel (NIR) detectors for 2D and 3D scans.
Thermal Evaporators
Instrument Manager: Steve Shelton
The facility has two thermal evaporators, both of which are integrated with nitrogen glove boxes and offer rate and thickness control. 1) The MBRAUN evaporator is used to deposit thin layers of organic and metallic materials onto substrates under vacuum conditions of up to 10–6 mbar. It can hold up to 4 different source materials for multilayer deposition. Codeposition of multiple sources is not available. An optional quartz lamp heater for substrate treatment is available. 2) The Angstrom Engineering evaporator is used to deposit thin layers of organic, metallic, and lead halide precursors. It is dedicated to processing samples containing perovskite materials and can hold up to 2 source materials for multilayer deposition (not co-deposition).
Nitrogen Glove Boxes
Instrument Manager: Steve Shelton
For sample processing (spin coating, solution preparation, hot plate use, device encapsulation) and for loading devices into sealed test cells for measurement outside of the box.
Probe Station
Instrument Manager: Steve Shelton
The Lakeshore CPX-HF Probe Station is used for testing devices up to 1” in diameter under vacuum (up to 10–5 torr), at temperatures between 4.2–400 K, and/or under a magnetic field (1 T horizontal field split-pair superconducting magnet, LHe cooling required). The probe station consists of a grounded sample holder and 4 micro-manipulated probe arms with 25-micron tip radius W or BeCu probe tips. An Agilent 4155C Semiconductor Parameter Analyzer is available for electrical measurements and is paired with a desktop EasyEXPERT software.
Photovoltaic Test Station
Instrument Manager: Steve Shelton
A 150 W Thermal-Oriel Solar Simulator (with AM1.5G filter) is available for measuring IV-characteristics of devices with a Keithley 2400 source meter. An Enlitech QE-R Solar Cell Quantum Efficiency Measurement System allows for measurement of both external and internal quantum efficiency (EQE and IQE) of devices from 300–1800 nm. The system includes an optional ±5 V voltage bias and 0–5 sun white light bias. Custom designed test cells are available for sealing devices in nitrogen for measurement outside of the glove box.
Veeco Dektak 150 Profilometer
Instrument Manager: Steve Shelton
The Dektak 150 surface profiler is a thin and thick film step height measurement tool used to profile surface topography and waviness, as well as measure surface roughness in the nanometer range. The compact system accommodates samples up to six inches in dimension and four inches thick, and is capable of measuring steps below 10 nm with a step-height repeatability of 0.6 nm. A 3D mapping option provides automation and programmability of up to 200 sites on samples of up to six inches in diameter.
Filmetrics F20 Thin-Film Analyzer
Instrument Manager: Steve Shelton
Measures thickness and refractive index from spectral reflectance data collected from the film sample, with thickness measurements in the range of 15 nm–100 um and wavelengths covering 380–1050 nm.
LED Test Station
Instrument Manager: Steve Shelton
Orb Optronix LED test station measures from 380–780 nm, consisting of a Keithley 2400 source meter and an integrating sphere to measure the electrical characteristics and luminescence.
Uvisel Plus Ellipsometer
Instrument Manger: Steve Shelton
Uvisel Plus ellipsometer characterizes thin films and interfaces in a spectral range of 190-2100nm. It is phase modulated for higher accuracy than ellipsometers with rotating elements. It’s highly versatile for thickness and optical constant measurements for single- and multi-layered thin films.
UVOCs UV-Ozone Cleaning System (Model T10x10/OES)
Instrument Manager: Steve Shelton
Spin coaters (located in nitrogen glove box, fume hood, and laminar flow hood)
