The Agilent Cary 5000 UV-Vis-NIR spectrometer measures absorbance from 175–3300 nm for solid, liquid, and thin film samples in transmission mode. An Internal Diffuse Reflectance Accessory (DRA-2500) allows for specular and diffuse reflectance measurements from 200–2500 nm for solid samples.
The Horiba Jobin Yvon NanoLog allows for excitation, emission, and 3D fluorescence measurements in the range of 330–1700 nm in both solution and solid state. It is equipped with a 450W broadband cw xenon lamp for excitation and three detectors (R928P PMT visible detector, InGaAs CCD NIR detector, and a R5509-73 PMT Visible/NIR detector). Lifetime measurements (in the range of ns to s) can be performed with the use of interchangeable, fixed-wavelength pulsed NanoLEDs (265 nm, 370 nm, 460 nm, 560 nm, and 590 nm) and SpectralLEDs (370 nm, 460 nm, 560 nm, and 590 nm). A low-temperature accessory is available for cooling solutions in liquid nitrogen.
The facility has two thermal evaporators, both of which are integrated with nitrogen glove boxes and offer rate and thickness control. 1) The MBRAUN evaporator is used to deposit thin layers of organic and metallic materials onto substrates under vacuum conditions of up to 10–6 mbar. It can hold up to 4 different source materials for multilayer deposition. Codeposition of multiple sources is not available. An optional quartz lamp heater for substrate treatment is available. 2) The Angstrom Engineering evaporator is used to deposit thin layers of organic, metallic, and lead halide precursors. It is dedicated to processing samples containing perovskite materials and can hold up to 2 source materials for multilayer deposition (not co-deposition).
Nitrogen Glove Boxes
For sample processing (spin coating, solution preparation, hot plate use, device encapsulation) and for loading devices into sealed test cells for measurement outside of the box.
The Lakeshore CPX-HF Probe Station is used for testing devices up to 1” in diameter under vacuum (up to 10–5 torr), at temperatures between 4.2–400 K, and/or under a magnetic field (1 T horizontal field split-pair superconducting magnet, LHe cooling required). The probe station consists of a grounded sample holder and 4 micro-manipulated probe arms with 25-micron tip radius W or BeCu probe tips. An Agilent 4155C Semiconductor Parameter Analyzer is available for electrical measurements and is paired with a desktop EasyEXPERT software.
Photovoltaic Test Station
A 150 W Thermal-Oriel Solar Simulator (with AM1.5G filter) is available for measuring IV-characteristics of devices with a Keithley 2400 source meter. An Enlitech QE-R Solar Cell Quantum Efficiency Measurement System allows for measurement of both external and internal quantum efficiency (EQE and IQE) of devices from 300–1800 nm. The system includes an optional ±5 V voltage bias and 0–5 sun white light bias. Custom designed test cells are available for sealing devices in nitrogen for measurement outside of the glove box.
Veeco Dektak 150 Profilometer
The Dektak 150 surface profiler is a thin and thick film step height measurement tool used to profile surface topography and waviness, as well as measure surface roughness in the nanometer range. The compact system accommodates samples up to six inches in dimension and four inches thick, and is capable of measuring steps below 10 nm with a step-height repeatability of 0.6 nm. A 3D mapping option provides automation and programmability of up to 200 sites on samples of up to six inches in diameter.
Filmetrics F20 Thin-Film Analyzer
Measures thickness and refractive index from spectral reflectance data collected from the film sample, with thickness measurements in the range of 15 nm–100 um and wavelengths covering 380–1050 nm.
LED Test Station
Orb Optronix LED test station measures from 380–780 nm, consisting of a Keithley 2400 source meter and an integrating sphere to measure the electrical characteristics and luminescence.
UVOCs UV-Ozone Cleaning System (Model T10x10/OES)
Spin coaters (located in nitrogen glove box, fume hood, and laminar flow hood)