Asylum MFP-3D Atomic Force Microscope
Contact: Thomas Darlington
This microscope has a 90 micron closed-loop XY scanner, Z displacement and integrated optical imaging. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, AMFM, nanoindentation, and magnetic imaging with variable field unit. The system has numerous small-volume closed fluid cell that can be used for rapid, controlled humidity experiments or liquid experiments with fluid exchange. Sample heating is available for work in liquids. The control software is easily customized for specialized force or lithography experiments.
Asylum Cypher Atomic Force Microscope
Contact: Paul Ashby
The Cypher ES is well suited for controlled environment AFM experiments. Specific gases or fluids can be delivered to a sealed cell including corrosives and organics. This microscope has a 40-micron scanner with high precision sensors allowing molecular lattice resolved imaging in closed loop. The integrated optics are excellent allowing precise positioning of the sample before engagement. It can only accommodate small samples of at most 25 mm in diameter. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, and AMFM. The Cypher is equipped with the VRS sample stage for high speed scanning at up to ~ 10 frames per second. Sample heating is available and the control software is easily customized.
Asylum Jupiter Atomic Force Microscope
Contact: Thomas Darlington
The Jupiter AFM is designed to be easy to use and scan large areas quickly making it ideal for our general user population. The software is highly automated which substantially reduces training requirements. The sample stage can access all area of 200mm wafers and provides a 100um scan range. A wide array of mechanical and electrical modes to complement rapid topographical imaging.
Park NX10 Photocurrent Microscope Under Controlled Environment
Contact: Thomas Darlington
The Park NX10 is an easy to use AFM capable of performing topographical and electrical characterization of materials. The 50 micron XY scanner and fast Z piezo provide high resolution imaging with low tip wear.
