Asylum MFP-3D Atomic Force Microscope
This microscope has a 90 micron closed-loop XY scanner, Z displacement and integrated optical imaging. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, AMFM, nanoindentation, and magnetic imaging with variable field unit. The system has numerous small-volume closed fluid cell that can be used for rapid, controlled humidity experiments or liquid experiments with fluid exchange. Sample heating is available for work in liquids. The control software is easily customized for specialized force or lithography experiments.
Bruker Multimode 8
This microscope has a 90 micron JV scanner for large scans, 10 micron EV scanner, and 1 micron A scanner for very high resolution work. An integrated optical microscope provides easy sample location with 5 micron resolution. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, Quantitative Nanomechanical Mapping (Peak Force Tapping). Sample temperature control is available. The closed fluid cell has 100 microliter volume for precious analytes. The control software is highly automated and easy to use.
Asylum Cypher Atomic Force Microscope
The Cypher ES is well suited for controlled environment AFM experiments. Specific gases or fluids can be delivered to a sealed cell including corrosives and organics. This microscope has a 40-micron scanner with high precision sensors allowing molecular lattice resolved imaging in closed loop. The integrated optics are excellent allowing precise positioning of the sample before engagement. It can only accommodate small samples of at most 25 mm in diameter. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, and AMFM. Sample heating is available and the control software is easily customized.
Park NX10 Photocurrent Microscope Under Controlled Environment
The Park NX10 is a very easy to use AFM, which includes all typical AFM, topography modes, Kelvin Probe Microscopy, etc. The main use of this microscope is to perform photo current and photo voltage measurements on photo active materials. Two additional specific features that attract users is the set up in a low noise glove box, allowing samples, such as perovskites that can photo oxidize, to be measured using this microscope, plus a special tip approach mode, which approaches the tip at a single measurement pixel, avoiding almost all topography – photo current signal convolution when measuring samples with large topographic features.
