Asylum MFP-3D Atomic Force Microscope
This microscope has a 90 micron closed-loop XY scanner, Z displacement and integrated optical imaging. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, AMFM, nanoindentation, and magnetic imaging with variable field unit. The system has numerous small-volume closed fluid cell that can be used for rapid, controlled humidity experiments or liquid experiments with fluid exchange. Sample heating is available for work in liquids. The control software is easily customized for specialized force or lithography experiments.
Bruker Multimode 8 Atomic Force Microscope
This microscope has a 90 micron JV scanner for large scans, 10 micron EV scanner, and 1 micron A scanner for very high resolution work. An integrated optical microscope provides easy sample location with 5 micron resolution. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, Quantitative Nanomechanical Mapping (Peak Force Tapping). Sample temperature control is available. The closed fluid cell has 100 microliter volume for precious analytes. The control software is highly automated and easy to use.
Asylum Cypher Atomic Force Microscope
The Cypher ES is well suited for controlled environment AFM experiments. Specific gases or fluids can be delivered to a sealed cell including corrosives and organics. This microscope has a 40-micron scanner with high precision sensors allowing molecular lattice resolved imaging in closed loop. The integrated optics are excellent allowing precise positioning of the sample before engagement. It can only accommodate small samples of at most 25 mm in diameter. A range of AFM contrast methods are available including contact imaging, non-contact (“tapping”) phase and amplitude imaging, electrical methods including conductivity, electrostatic and Kelvin probe surface potential imaging, mechanical methods including loss tangent, contact resonance, and AMFM. The Cypher is equipped with the VRS sample stage for high speed scanning at up to ~ 10 frames per second. Sample heating is available and the control software is easily customized.
Asylum Jupiter Atomic Force Microscope
The Jupiter AFM is designed to be easy to use and scan large areas quickly making it ideal for our general user population. The software is highly automated which substantially reduces training requirements. The sample stage can access all area of 200mm wafers and provides a 100um scan range. A wide array of mechanical and electrical modes to complement rapid topographical imaging.
Park NX10 Photocurrent Microscope Under Controlled Environment
The Park NX10 is an easy to use AFM capable of performing topographical and electrical characterization of materials. The 50 micron XY scanner and fast Z piezo provide high resolution imaging with low tip wear.
