Principal Scientific Engineering Associate, NCEM
510.486.6751
Biography
Education
- B.S. in Materials Science, Zhejiang University, China
- M.S. in high Tc superconductor structure and property, Shanghai Institute of Ceramics, Chinese Academy of Sciences
Expertise
Technical support for TEAM microscopes, Tecnai, CM300, and CM200. Secondary support for Titan-X, 3010, FIB, and specimen preparation. High resolution TEM and STEM, mono-chromated EELS, image and probe aberration corrector tuning, and X-sectional TEM sample preparation.
