Principal Scientific Engineering Associate, NCEM
Karen Bustillo obtained her Ph.D in Materials Science and Engineering from the University of California, Berkeley. Her doctoral work focused on the optical properties of semiconductor nanoparticles. Her M.S. degree research involved using solid state NMR to study bonding configurations in amorphous carbon. In addition to transmission electron microscopy, Karen has expertise in Raman, photoluminescence, FTIR, and UVVis spectroscopies, as well as a variety of conventional semiconductor processes.
Karen is the staff member overseeing the FEI TitanX and Zeiss Libra microscopes, and she can assist with the JEOL 3010, FEI Tecnai, and TEAM I microscopes. In addition to conventional TEM methods, she is available to train users in the following techniques:
- Insitu experiments including cryo, heating, mechanical testing, Protochips platform (heating and biasing), and liquid cell
- EDS and EDS tomography
- STEM tomography
- Offaxis holography
- EELS and EFTEM
- 4D-STEM for strainmapping, diffraction mapping, and fluctuation microscopy
- Detectors/cameras: K2, insitu movies, image acquisition
Dr. Bustillo’s research interests include imaging of organic materials using advanced techniques such as scanning nanobeam diffraction. She pursues characterization of nanostructures using of the EDS capabilities of the TEM especially with respect to elemental quantification and data analysis. In the past her research focused on plasmonic nanoparticles: nonequilibrium phases, lowloss plasmon mapping, and structure. She used the electron microscope to do EELS mapping and insitu heating and quenching. She is also interested in electron detector development.